Grain yield

Indirect selection for resistance to ear rot and leaf diseases in maize lines using biplots

G. S. Pereira, Camargos, R. B., Balestre, M., Von Pinho, R. G., and Melo, W. M. C., Indirect selection for resistance to ear rot and leaf diseases in maize lines using biplots, vol. 14, pp. 11052-11062, 2015.

Leaf disease and ear rot have caused reductions in maize yield in Brazil and other producer countries. Therefore, the aims of this study were to analyze the association between husked ear yield and the severity of maize white spot, gray leaf spot, helminthosporium, and ear rot caused by Fusarium verticillioides and Diplodia maydis using biplots in a mixed-model approach. The responses of 238 lines introduced to Brazil and four controls were evaluated using an incomplete block design with three replicates in two locations: Lavras and Uberlândia, Minas Gerais, Brazil.

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